Reference number
ISO 24173:2009
ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Edition 1
2009-09
Withdrawn
ISO 24173:2009
42052
Withdrawn (Edition 1, 2009)

Abstract

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

General information

  •  : Withdrawn
     : 2009-09
    : Withdrawal of International Standard [95.99]
  •  : 1
     : 43
  • ISO/TC 202
    71.040.50 
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Life cycle

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