ISO 14975:2000

Published (Edition 1, 2000)

This publication was last reviewed and confirmed in 2022. Therefore this version remains current.

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Abstract

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion

and revision of a surface chemical analysis spectral database. The format is applied to Auger electron

spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

This standard contributes to the following Sustainable Development Goal

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