Reference number
ISO 9220:1988
© ISO 2024
ISO 9220:1988
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Edition 1
1988-10
Withdrawn
Withdrawn (Edition 1, 1988)

Abstract

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

General information

  • Status
     : Withdrawn
    Publication date
     : 1988-10
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 5
  • Technical Committee :
    ISO/TC 107
    ICS :
    25.220.40 
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