ISO/AWI 12179
u
ISO/AWI 12179
86679

Estado : En desarrollo

Resumen

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.

Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Informaciones generales

  •  : En desarrollo
    : Nuevo proyecto registrado en el programa de trabajo TC/SC [20.00]
  •  : 3
  • ISO/TC 213
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