Reference number
ISO/TS 11888:2017
Technical Specification
ISO/TS 11888:2017
Nanotechnologies — Characterization of multiwall carbon nanotubes — Mesoscopic shape factors
Edition 2
2017-07
Technical Specification
Preview
ISO/TS 11888:2017
69549
No disponible en español
Publicado (Edición 2, 2017)
Esta publicación se revisó y confirmó por última vez en 2024. Por lo tanto, esta versión es la actual.

ISO/TS 11888:2017

ISO/TS 11888:2017
69549
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Resumen

ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis.

ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

Informaciones generales

  •  : Publicado
     : 2017-07
    : Norma Internacional confirmada [90.93]
  •  : 2
     : 18
  • ISO/TC 229
    07.120 
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