International Standard
ISO 18554:2016
Surface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Reference number
ISO 18554:2016
Edición 1
2016-03
International Standard
Vista previa
ISO 18554:2016
62874
No disponible en español
Publicado (Edición 1, 2016)
Esta norma se revisó y confirmó por última vez en 2021. Por lo tanto, esta versión es la actual.

ISO 18554:2016

ISO 18554:2016
62874
Idioma
Formato
CHF 96
Convertir Franco suizo (CHF) a tu moneda

Resumen

ISO 18554:2016 provides a simple procedure for identifying, estimating and correcting for unintended degradation in the elemental composition or chemical state of a material which occurs as a result of X-radiation during the time that a specimen material is exposed to the X-rays used in X-ray photoelectron spectroscopy (XPS).

ISO 18554:2016 does not address comparisons between different types of material nor does it address the mechanisms, depth, or chemical nature of the degradation that occurs. The correction procedure proposed is only valid if the changes are caused by the X-rays and result in less than a 30 % reduction or increase in intensity of a chosen photoelectron peak from the sample material.

Informaciones generales

  •  : Publicado
     : 2016-03
    : Norma Internacional confirmada [90.93]
  •  : 1
     : 17
  • ISO/TC 201/SC 7
    71.040.40 
  • RSS actualizaciones

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