Filtrar :
Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 3 Secretaría | Etapa | ICS |
---|---|---|
Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals
|
20.00 |
|
Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing
|
20.20 |
|
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
|
95.99 | |
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
|
60.60 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
90.92 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
60.00 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
|
60.60 | |
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
|
60.60 | |
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope
|
95.99 | |
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
90.92 | |
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
40.60 | |
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
|
95.99 | |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
95.99 | |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
60.60 |
No se ha encontrado ningún registro que coincida. Pruebe a cambiar los ajustes de filtro.