Filtrar :
Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 1 Secretaría Etapa ICS
Microbeam analysis — Analytical electron microscopy — Vocabulary
90.60
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
50.00
Microbeam analysis — Scanning electron microscopy — Vocabulary
95.99
Microbeam analysis — Scanning electron microscopy — Vocabulary
90.20
Microbeam Analysis — Electron Backscatter Diffraction — Vocabulary
30.60
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
95.99
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
90.60

No se ha encontrado ningún registro que coincida. Pruebe a cambiar los ajustes de filtro.